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Wafer-scale transfer route for top–down III-nitride nanowire LED arrays based on the femtosecond laser lift-off technique

ORCID
0000-0001-7792-7881
Affiliation/Institute
Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig
Yulianto, Nursidik;
Affiliation/Institute
Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig
Refino, Andam Deatama;
Affiliation/Institute
Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig
Syring, Alina; Majid, Nurhalis;
Affiliation/Institute
Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig
Mariana, Shinta; Schnell, Patrick; Wahyuono, Ruri Agung; Triyana, Kuwat;
Affiliation/Institute
Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig
Meierhofer, Florian; Daum, Winfried; Abdi, Fatwa F.;
Affiliation/Institute
Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig
Voss, Tobias;
ORCID
0000-0002-4522-3625
Affiliation/Institute
Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig
Wasisto, Hutomo Suryo;
ORCID
0000-0002-2724-1686
Affiliation/Institute
Institute of Semiconductor Technology (IHT), Technische Universität Braunschweig
Waag, Andreas

The integration of gallium nitride (GaN) nanowire light-emitting diodes (nanoLEDs) on flexible substrates offers opportunities for applications beyond rigid solid-state lighting (e.g., for wearable optoelectronics and bendable inorganic displays). Here, we report on a fast physical transfer route based on femtosecond laser lift-off (fs-LLO) to realize wafer-scale top–down GaN nanoLED arrays on unconventional platforms. Combined with photolithography and hybrid etching processes, we successfully transferred GaN blue nanoLEDs from a full two-inch sapphire substrate onto a flexible copper (Cu) foil with a high nanowire density (~107 wires/cm2), transfer yield (~99.5%), and reproducibility. Various nanoanalytical measurements were conducted to evaluate the performance and limitations of the fs-LLO technique as well as to gain insights into physical material properties such as strain relaxation and assess the maturity of the transfer process. This work could enable the easy recycling of native growth substrates and inspire the development of large-scale hybrid GaN nanowire optoelectronic devices by solely employing standard epitaxial LED wafers (i.e., customized LED wafers with additional embedded sacrificial materials and a complicated growth process are not required).

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